Contact
Sioux Precision Power Supply Banner

ANALYTICAL

Precision SEM High Voltage Supplies

Ultra-low ripple and drift for nanometre-scale for SEM imaging

Reliable high-voltage control for more accurate system performance

  • PRECISION HIGH-VOLTAGE FOR ADVANCED BEAM CONTROL
    Sioux delivers high-voltage solutions with ultra-low ripple and ppm-level stability for precise control of electron and ion beams in semiconductor and analytical equipment.

  • CUSTOMIZABLE TO YOUR APPLICATION
    We can customize high-voltage supplies to your SEM, metrology, wafer inspection, or analytical system, adapting output configurations, communication interfaces, and safety functions. An off-the-shelf solution is also available.

  • SPECIALIST EXPERTISE IN HIGH-VOLTAGE PERFORMANCE
    Our expertise combines low-noise analogue design, electrostatic field modelling, and high-voltage operation in vacuum. We address ripple, drift, and discharge behaviour to support stable beam control and reliable instrument performance.

Industry challenges

banner.png

Shrinking nodes demand higher measurement accuracy

As semiconductor devices continue to shrink, the demand for advanced electron-beam metrology and inspection systems continues to grow. Applications such as CD-SEM, defect review and wafer inspection require exceptional beam stability to deliver the measurement accuracy needed for next-generation process control.
Precision Electron Optics In The Lab

Transition to advanced device architectures

Advanced electron-optical systems increasingly rely on precise control of beam energy, landing energy, and electrostatic lens configurations. As multi-beam and low-energy inspection techniques become mainstream, voltage ripple, drift, and channel matching become critical performance parameters. High-voltage stability is no longer a component specification but a key enabler of imaging and inspection performance.
Expertise Mass Spectrometry

Improving Quantitative Accuracy

Advanced mass spectrometry applications require exceptional measurement repeatability across long analytical runs. Voltage drift and noise can influence ion transmission efficiency and detector response, impacting quantitative accuracy. High-stability power supplies help ensure consistent analytical results and reduced recalibration requirements.
Expertise Increased Integration

Increased System Integration and Miniaturization

High-voltage power systems are expected to deliver greater precision, lower noise, higher power density, and enhanced safety within increasingly constrained space envelopes.
High Voltage
Precision Supply

  • 30

    kV

    Output Voltage

  • 50

    ppm

    stability

Key features

High Voltage 2

Ultra-Stable High-Voltage Performance

Delivers ppm-level voltage stability and ultra-low output ripple to ensure exceptional electron beam stability, reduced drift, and highly repeatable imaging and measurement performance.
Analytics Electron Microscope Workstation

Integrated Multi-Output Platform

Combines accelerator, suppressor, extractor, and filament supplies in a single modular platform, simplifying integration and reducing system complexity for Electron Beam manufacturers.
1.png

Designed for Advanced Electron Optics

Supports demanding SEM, metrology, and wafer inspection applications where beam quality, measurement accuracy, and long-term stability are critical.
Analytics Microscope Modules

Flexible OEM Integration

Modular architecture enables customization of voltage ranges, communication interfaces, safety functions, and form factors to fit application-specific requirements.

WHAT IS YOUR CHALLENGE?

Share your challenge with us, and we'll help bring your high-tech solution to life.

Contact us