Optical system design
Sioux develops optical systems around the information your instrument needs to capture.
Illumination & lens design
Microscopy
Digital holography
Computational imaging
ANALYTICAL
From proof of concept to industrialized systems ready for the lab
ADVANCING ANALYTICAL INSTRUMENTS ACROSS MICRO- AND NANOSCALES
DRIVING TECHNOLOGICAL PROGRESS
Semiconductor scaling, EV electrification, advanced life sciences and materials innovation depend on increasingly precise inspection and analysis at smaller scales.
MEETING HIGHER PERFORMANCE DEMANDS
Instruments must deliver higher resolution, greater throughput, improved reliability and lower cost of ownership, while innovation cycles continue to accelerate.
Trusted by leading analytical OEM's
Sioux develops optical systems around the information your instrument needs to capture.
Illumination & lens design
Microscopy
Digital holography
Computational imaging
Sioux combines X-ray hardware and image processing in one integrated system design, aligning acquisition and reconstruction with your instrument’s measurement requirements and operating conditions.
X-ray sources and collimators
Detector integration and data acquisition
X-ray computed tomography (CT)
X-ray condition monitoring
Image processing and reconstruction
Sioux integrates electron-beam technology, electronics, and software into analytical instruments, connecting sources, beam control, and detection across the complete measurement chain.
Single- and multi-beam electron sources
Beam shaping and control
Electron detectors and signal processing
Electron microscopy
Material analysis and EDX detection
Sioux develops high-voltage modules for analytical instruments where voltage stability affects measurement quality, combining analogue electronics and mechanical integration for compact designs and vacuum operation.
High-stability voltage control up to 100kV
Ultra High Stability
Low drift and low noise
Electrostatic field modelling
High-voltage operation in vacuum
Compact module integration
Sioux develops acquisition and processing modules to match your instrument’s throughput requirements, balancing latency, heat dissipation, power consumption, and component availability.
Massively Parallel Acquisition
FPGA (VHDL) / GPU / TPU-based processing
High-speed signal processing Terabytes / Sec
Thermal management and power optimization
Electron-beam data processing for wafer inspection
Edge Computing (AI)
Sioux connects instrument control, user applications, and measurement data in one software architecture. Model-driven development and simulation help identify integration issues before deployment on the physical instrument.
System control and application software
Signal processing algorithms
Image analysis and data interpretation
Applied AI for analytical tasks
Model-driven development and simulation
Sioux develops optical systems around the information your instrument needs to capture.
Illumination & lens design
Microscopy
Digital holography
Computational imaging
Sioux combines X-ray hardware and image processing in one integrated system design, aligning acquisition and reconstruction with your instrument’s measurement requirements and operating conditions.
X-ray sources and collimators
Detector integration and data acquisition
X-ray computed tomography (CT)
X-ray condition monitoring
Image processing and reconstruction
Sioux integrates electron-beam technology, electronics, and software into analytical instruments, connecting sources, beam control, and detection across the complete measurement chain.
Single- and multi-beam electron sources
Beam shaping and control
Electron detectors and signal processing
Electron microscopy
Material analysis and EDX detection
Sioux develops high-voltage modules for analytical instruments where voltage stability affects measurement quality, combining analogue electronics and mechanical integration for compact designs and vacuum operation.
High-stability voltage control up to 100kV
Ultra High Stability
Low drift and low noise
Electrostatic field modelling
High-voltage operation in vacuum
Compact module integration
Sioux develops acquisition and processing modules to match your instrument’s throughput requirements, balancing latency, heat dissipation, power consumption, and component availability.
Massively Parallel Acquisition
FPGA (VHDL) / GPU / TPU-based processing
High-speed signal processing Terabytes / Sec
Thermal management and power optimization
Electron-beam data processing for wafer inspection
Edge Computing (AI)
Sioux connects instrument control, user applications, and measurement data in one software architecture. Model-driven development and simulation help identify integration issues before deployment on the physical instrument.
System control and application software
Signal processing algorithms
Image analysis and data interpretation
Applied AI for analytical tasks
Model-driven development and simulation
WHAT IS YOUR CHALLENGE?
Share your challenge with us, and we'll help bring your high-tech solution to life.
Contact Us